Defect engineering in TiO2 thin films: Recent advances in optical and electronic properties and sensing applications. Al-Noor Journal of Engineering Management and Computer Science, [S. l.], v. 2, n. 4, p. 233–245, 2026. DOI: 10.71229/7vtx0k86. Disponível em: https://njemcs.edu.iq/index.php/njemcs/article/view/166. Acesso em: 9 sep. 2026.